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1 Ergebnisse
1
The smart ICeGaNTM platform with sensing and protection fun..:
, In:
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Udrea, Florin
;
Arnold, Martin
;
Efthymiou, Loizos
... - p. 41-44 , 2022
Link:
https://doi.org/10.1109/ISPSD49238.2022.9813659
RT T1 <cTitle>2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>The smart ICeGaNTM platform with sensing and protection functions for both enhanced ease of use and gate reliability</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9813659&Exemplar=1&LAN=DE A1 Udrea, Florin A1 Arnold, Martin A1 Efthymiou, Loizos A1 Ansari, Zahid A1 Fung, Orange A1 Findlay, John A1 Ledins, Kaspars A1 Longobardi, Giorgia YR 2022 SN 1946-0201 K1 Performance evaluation K1 Logic gates K1 HEMTs K1 Threshold voltage K1 Sensors K1 Clamps K1 Gallium nitride K1 pGaN K1 enhancement mode K1 GaN IC K1 power IC K1 current sense K1 gate reliability K1 miller clamp K1 threshold voltage SP 41 OP 44 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD49238.2022.9813659 DO https://doi.org/10.1109/ISPSD49238.2022.9813659 SF ELIB - SuUB Bremen
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