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1 Ergebnisse
1
Unsupervised Learning for Detection of Defects in Pulsed In..:
, In:
2022 IEEE International Conference on Electro Information Technology (eIT)
,
Zhang, Xin
;
Saniie, Jafar
;
Bakhtiari, Sasan
. - p. 330-334 , 2022
Link:
https://doi.org/10.1109/eIT53891.2022.9814026
RT T1 <cTitle>2022 IEEE International Conference on Electro Information Technology (eIT)</cTitle>: T1 <Title>Unsupervised Learning for Detection of Defects in Pulsed Infrared Thermography of Metals</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9814026&Exemplar=1&LAN=DE A1 Zhang, Xin A1 Saniie, Jafar A1 Bakhtiari, Sasan A1 Heifetz, Alexander YR 2022 SN 2154-0373 K1 Training K1 Fabrication K1 Machine learning algorithms K1 Microscopy K1 Metals K1 Benchmark testing K1 Velocity measurement K1 Unsupervised Learning K1 Metallic Microscopic Defects Detection K1 Pulsed Infrared Thermography K1 Metal Additively Manufacturing SP 330 OP 334 LK http://dx.doi.org/https://doi.org/10.1109/eIT53891.2022.9814026 DO https://doi.org/10.1109/eIT53891.2022.9814026 SF ELIB - SuUB Bremen
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