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1 Ergebnisse
1
Interconnection Reliability of Mini LEDs for Display Applic..:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Kye, In-Seok
;
Joo, Jiho
;
Choi, Gwang-Mun
... - p. 1184-1191 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00190
RT T1 <cTitle>2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Interconnection Reliability of Mini LEDs for Display Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9816382&Exemplar=1&LAN=DE A1 Kye, In-Seok A1 Joo, Jiho A1 Choi, Gwang-Mun A1 Lee, Chanmi A1 Jang, Ki-Seok A1 Eom, Yong-Sung A1 Choi, Kwang-Seong A1 Oh, Yong-Jun YR 2022 SN 2377-5726 K1 Temperature measurement K1 Optical interconnections K1 Optical variables measurement K1 Light emitting diodes K1 Silicon K1 Reliability K1 Soldering K1 Micro/Mini LED display K1 simultaneous transferring and bonding (SITRAB) K1 SITRAB adhesive K1 Shear strength K1 Intermetallic compound (IMC) K1 Light-Current-Voltage (L-I-V) SP 1184 OP 1191 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00190 DO https://doi.org/10.1109/ECTC51906.2022.00190 SF ELIB - SuUB Bremen
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