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1 Ergebnisse
1
Die to Wafer Hybrid Bonding for Chiplet and Heterogeneous I..:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Gao, Guilian
;
Mirkarimi, Laura
;
Fountain, Gill
... - p. 1975-1981 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00310
RT T1
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
: T1
Die to Wafer Hybrid Bonding for Chiplet and Heterogeneous Integration: Die Size Effects Evaluation-Small Die Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9816427&Exemplar=1&LAN=DE A1 Gao, Guilian A1 Mirkarimi, Laura A1 Fountain, Gill A1 Suwito, Dominik A1 Theil, Jeremy A1 Workman, Thomas A1 Uzoh, Cyprian A1 Lee, Bongsub A1 Bang, K.M. A1 Guevara, Gabe YR 2022 SN 2377-5726 K1 Temperature sensors K1 Scanning electron microscopy K1 Temperature distribution K1 Annealing K1 Microscopy K1 Random access memory K1 Solids K1 Cu-Cu hybrid bonding K1 direct bond interconnect (DBI) K1 DBI Ultra K1 hybrid bonding K1 D2W K1 D2D K1 small die K1 dicing K1 die-on-tape processing SP 1975 OP 1981 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00310 DO https://doi.org/10.1109/ECTC51906.2022.00310 SF ELIB - SuUB Bremen
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