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Trust Validation of Chiplets using a Physical Inspection ba..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Vashistha, Nidish ; Al Hasan, Md Mahfuz ; Asadizanjani, Navid.. - p. 2311-2320 , 2022
Link: https://doi.org/10.1109/ECTC51906.2022.00365