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1 Ergebnisse
1
A Novel Simulation Methodology Reflecting System Power Scen..:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Na, Woo-Jin
;
Joo, Kun
;
Sung, Rak-Joo
... - p. 929-936 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00151
RT T1 <cTitle>2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>A Novel Simulation Methodology Reflecting System Power Scenario using a Markov-Chain-based Stochastic Random Power Model</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9816494&Exemplar=1&LAN=DE A1 Na, Woo-Jin A1 Joo, Kun A1 Sung, Rak-Joo A1 Lee, Kyu-Dong A1 Yang, Ji-Hye A1 Kim, Kyung-Sun A1 Lee, Young-Ho A1 Mun, Seung-Hee A1 Park, Sung-Joo A1 Cho, Jeong-Hyeon YR 2022 SN 2377-5726 K1 Voltage measurement K1 Power measurement K1 Switching frequency K1 Stochastic processes K1 Random access memory K1 Predictive models K1 Software K1 component K1 Power Intergrity K1 Power Model K1 CPM K1 Current Profile K1 DRAM K1 Markov-Chain SP 929 OP 936 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00151 DO https://doi.org/10.1109/ECTC51906.2022.00151 SF ELIB - SuUB Bremen
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