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Optical performance and reliability assessment from self-al..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),

Cho, Jae Kyu ; Hirokawa, Takako ; Pellerin, John... - p. 403-409 , 2022

Link: https://doi.org/10.1109/ECTC51906.2022.00072

RT 
T1 <cTitle>2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Optical performance and reliability assessment from self-aligned single mode fiber attach for O-band silicon photonics platform</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9816513&Exemplar=1&LAN=DE
				
A1 Cho, Jae Kyu
A1 Hirokawa, Takako
A1 Pellerin, John
A1 Fasano, Benjamin
A1 Bian, Yusheng
A1 Giewont, Ken
A1 Karra, Vaishnavi
A1 Ramachandra, Koushik
A1 Nummy, Karen
A1 Cestero, Alberto
A1 Parker, George
A1 Riggs, Dave
A1 Robson, Norman
A1 Melville, Ian
A1 Janta-Polczynski, Alexsander
A1 Wu, George Zhuo-Jie
A1 Berger, Daniel
A1 Langlois, Richard
A1 Houghton, Thomas
A1 Gupta, Vikas
YR 2022
SN 2377-5726
K1 Integrated optics
K1 Optical fiber losses
K1 Optical interconnections
K1 Optical device fabrication
K1 Insertion loss
K1 Silicon photonics
K1 Metamaterials
K1 optical I/O interconnect
K1 fiber attach
K1 self alignment
K1 reliability assessment
SP 403
OP 409
LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00072
DO https://doi.org/10.1109/ECTC51906.2022.00072
SF ELIB - SuUB Bremen

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