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1 Ergebnisse
1
Broadband Characterization of Polymers under Reliability St..:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Pantano, Nicolas
;
Chery, Emmanuel
;
De Beeck, Maaike Op
.. - p. 1218-1223 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00195
RT T1 <cTitle>2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Broadband Characterization of Polymers under Reliability Stresses and Impact of Capping Layer</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9816598&Exemplar=1&LAN=DE A1 Pantano, Nicolas A1 Chery, Emmanuel A1 De Beeck, Maaike Op A1 Slabberkoorn, John A1 Beyne, Eric YR 2022 SN 2377-5726 K1 Temperature measurement K1 Radio frequency K1 Permittivity measurement K1 Materials reliability K1 Oxidation K1 Loss measurement K1 Polymers K1 3D packaging K1 fine pitch RDL K1 Photosensitive Polymer K1 Reliability K1 RF SP 1218 OP 1223 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00195 DO https://doi.org/10.1109/ECTC51906.2022.00195 SF ELIB - SuUB Bremen
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