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Self-healing of Interconnect Cracks for Reliable and Defect..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Hassan, Akeeb Yunus ; Banerjee, Reshmi ; Tomitaka, Asahi. - p. 1556-1561 , 2022
Link: https://doi.org/10.1109/ECTC51906.2022.00248