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1 Ergebnisse
1
Mechanical properties and microstructures of Cu/In-48Sn all..:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Kang, Dong Gil
;
Deuk Min, Kyung
;
Jung, Hak San
... - p. 2206-2210 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00348
RT T1
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
: T1
Mechanical properties and microstructures of Cu/In-48Sn alloy/Cu with low temperature TLP bonding
UL https://suche.suub.uni-bremen.de/peid=ieee-9816622&Exemplar=1&LAN=DE A1 Kang, Dong Gil A1 Deuk Min, Kyung A1 Jung, Hak San A1 Ha, Eun A1 Kim, Kyung Yeol A1 Jung, Seung-Boo YR 2022 SN 2377-5726 K1 Temperature K1 Silicon carbide K1 Photonic band gap K1 Metals K1 Mechanical factors K1 Microstructure K1 Reliability K1 Soldering K1 SAC 305 K1 TLP bonding K1 intermetallic compounds K1 kirkendall void SP 2206 OP 2210 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00348 DO https://doi.org/10.1109/ECTC51906.2022.00348 SF ELIB - SuUB Bremen
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