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1 Ergebnisse
1
300mm Full Thickness Si-Based IC Singulation Using Plasma D..:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Surapaneni, R.
;
Hamlin, B. S.
;
Chiu, J.
... - p. 1019-1024 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00166
RT T1
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
: T1
300mm Full Thickness Si-Based IC Singulation Using Plasma Dicing for Advanced Packaging Technologies
UL https://suche.suub.uni-bremen.de/peid=ieee-9816639&Exemplar=1&LAN=DE A1 Surapaneni, R. A1 Hamlin, B. S. A1 Chiu, J. A1 Brun, X. F. A1 Barnett, R. A1 Muggeridge, M. A1 Bhasker, H. A1 Richards, N. YR 2022 SN 2377-5726 K1 Blades K1 Satellite broadcasting K1 Glass K1 Ring lasers K1 Packaging K1 Plasma measurements K1 Silicon K1 Plasma Dicing K1 Bosch Process K1 Full thickness Si Singulation K1 Advanced Packaging SP 1019 OP 1024 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00166 DO https://doi.org/10.1109/ECTC51906.2022.00166 SF ELIB - SuUB Bremen
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