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1 Ergebnisse
1
Advanced Chip Last Process Integration for Fan Out WLP:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Yoo, Taewon
;
Lee, Seok Hyun
;
Suk, Kyoung Lim
... - p. 1371-1375 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00220
RT T1
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
: T1
Advanced Chip Last Process Integration for Fan Out WLP
UL https://suche.suub.uni-bremen.de/peid=ieee-9816684&Exemplar=1&LAN=DE A1 Yoo, Taewon A1 Lee, Seok Hyun A1 Suk, Kyoung Lim A1 Kim, Eung Kyu A1 Choi, Won Kyoung A1 Kim, Dae-Woo A1 Kim, Dong Wook YR 2022 SN 2377-5726 K1 Fans K1 Thermal resistance K1 Thermomechanical processes K1 Metals K1 Reliability engineering K1 Electronic packaging thermal management K1 Thermal conductivity K1 Re-destribution layer(RDL) K1 Fan Out Wafer Level Packaging K1 Heterogeneous Integration K1 Chip Last SP 1371 OP 1375 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00220 DO https://doi.org/10.1109/ECTC51906.2022.00220 SF ELIB - SuUB Bremen
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