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1 Ergebnisse
1
Swelling Analysis of Negative-tone Photosensitive Dielectri..:
, In:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
,
Yukimori, Daiki
;
Inoue, Go
;
Ishikawa, Nobuhiro
.. - p. 1996-2001 , 2022
Link:
https://doi.org/10.1109/ECTC51906.2022.00314
RT T1 <cTitle>2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)</cTitle>: T1 <Title>Swelling Analysis of Negative-tone Photosensitive Dielectric Materials for Fine Pitch Redistribution Layers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9816742&Exemplar=1&LAN=DE A1 Yukimori, Daiki A1 Inoue, Go A1 Ishikawa, Nobuhiro A1 Sekiguchi, Atsushi A1 Ogata, Toshiyuki YR 2022 SN 2377-5726 K1 Temperature sensors K1 Temperature measurement K1 Insulation K1 Dielectric materials K1 Materials reliability K1 Voltage K1 Temperature control K1 fine pitch RDL K1 negative-tone K1 photosensitive dielectric material K1 QCM K1 swelling K1 insulation reliability SP 1996 OP 2001 LK http://dx.doi.org/https://doi.org/10.1109/ECTC51906.2022.00314 DO https://doi.org/10.1109/ECTC51906.2022.00314 SF ELIB - SuUB Bremen
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