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Coarse-to-fine defect detection of heritage 3D models using..:

, In: 2022 IEEE 5th International Conference on Industrial Cyber-Physical Systems (ICPS),
Arvanitis, Gerasimos ; Nousias, Stavros ; Lalos, Aris S.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/ICPS51978.2022.9816869