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Study on the Dynamic Ron Degradation in GaN-based Power HEM:

, In: 2022 IEEE 5th International Conference on Electronics Technology (ICET),
Zhang, Jiaoqi ; Sun, Shaoyu ; Xia, Ling.. - p. 169-172 , 2022
Link: https://doi.org/10.1109/ICET55676.2022.9825118