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Detection and Classification of PCB Defects using Deep Lear..:

, In: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS),
Legon, Andria ; Deo, Makarand ; Albin, Sacharia. - p. 1-6 , 2022
Link: https://doi.org/10.1109/MDTS54894.2022.9826925