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1 Ergebnisse
1
A Hybrid Indirect ToF Image Sensor for Long-Range 3D Depth ..:
, In:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Hatakeyama, Kunihiro
;
Okubo, Yu
;
Nakagome, Tomohiro
... - p. 46-47 , 2022
Link:
https://doi.org/10.1109/VLSITechnologyandCir46769.2022..
RT T1 <cTitle>2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>A Hybrid Indirect ToF Image Sensor for Long-Range 3D Depth Measurement under High Ambient Light Conditions</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9830139&Exemplar=1&LAN=DE A1 Hatakeyama, Kunihiro A1 Okubo, Yu A1 Nakagome, Tomohiro A1 Makino, Masahiro A1 Takashima, Hiroshi A1 Akutsu, Takahiro A1 Sawamoto, Takehide A1 Nagase, Masanori A1 Noguchi, Tatsuo A1 Kawahito, Shoji YR 2022 SN 2158-9682 K1 Image sensors K1 Three-dimensional displays K1 Pulse measurements K1 Modulation K1 Interference K1 Very large scale integration K1 Logic gates K1 iToF K1 hToF K1 Multi Tap K1 Long-Range Measurement K1 Short Pulse K1 Drain Gate K1 Ambient Light K1 Multi TW K1 Subframe SP 46 OP 47 LK http://dx.doi.org/https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830139 DO https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830139 SF ELIB - SuUB Bremen
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