I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Enabling Active Backside Technology for ESD and LU Reliabil..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Serbulova, K. ; Chen, S.-H. ; Hellings, G.... - p. 431-432 , 2022
Link: https://doi.org/10.1109/VLSITechnologyandCir46769.2022..