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1 Ergebnisse
1
High Performance Thermally Resistant FinFETs DRAM Periphera..:
, In:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Ritzenthaler, R.
;
Capogreco, E.
;
Dupuy, E.
... - p. 306-307 , 2022
Link:
https://doi.org/10.1109/VLSITechnologyandCir46769.2022..
RT T1 <cTitle>2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>High Performance Thermally Resistant FinFETs DRAM Peripheral CMOS FinFETs with VTH Tunability for Future Memories</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9830186&Exemplar=1&LAN=DE A1 Ritzenthaler, R. A1 Capogreco, E. A1 Dupuy, E. A1 Arimura, H. A1 Bastos, J. P. A1 Favia, P. A1 Sebaai, F. A1 Radisic, D. A1 Nguyen, V. T. H. A1 Mannaert, G. A1 Chan, B. T. A1 Machkaoutsan, V. A1 Yoon, Y. A1 Itokawa, H. A1 Yamaguchi, M. A1 Chen, Y. A1 Fazan, P. A1 Subramanian, S. A1 Spessot, A. A1 Dentoni Litta, E. A1 Samavedam, S. A1 Horiguchi, N. YR 2022 SN 2158-9682 K1 Annealing K1 Random access memory K1 Logic gates K1 Very large scale integration K1 FinFETs K1 Transistors K1 Tuning SP 306 OP 307 LK http://dx.doi.org/https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830186 DO https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830186 SF ELIB - SuUB Bremen
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