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Specificities of linear Si QD arrays integration and charac..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),

Niebojewski, H. ; Bertrand, B. ; Nowak, E.... - p. 415-416 , 2022

Link: https://doi.org/10.1109/VLSITechnologyandCir46769.2022..

RT 
T1 <cTitle>2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Specificities of linear Si QD arrays integration and characterization</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9830352&Exemplar=1&LAN=DE
				
A1 Niebojewski, H.
A1 Bertrand, B.
A1 Nowak, E.
A1 Bedecarrats, T.
A1 Paz, B. Cardoso
A1 Contamin, L.
A1 Mortemousque, P.A.
A1 Labracherie, V.
A1 Brevard, L.
A1 Sahin, H.
A1 Charbonnier, J.
A1 Thomas, C.
A1 Assous, M.
A1 Casse, M.
A1 Urdampilleta, M.
A1 Niquet, Y.-M.
A1 Perruchot, F.
A1 Gaillard, F.
A1 De Franceschi, S.
A1 Meunier, T.
A1 Vinet, M.
YR 2022
SN 2158-9682
K1 Temperature distribution
K1 Protocols
K1 Qubit
K1 Quantum dots
K1 Cryogenics
K1 Logic gates
K1 Very large scale integration
K1 quantum dots
K1 qubits
K1 FDSOI
K1 variability
SP 415
OP 416
LK http://dx.doi.org/https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830352
DO https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830352
SF ELIB - SuUB Bremen

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