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1 Ergebnisse
1
Advanced novel optical stack technologies for high SNR in C..:
, In:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Park, Hye Yeon
;
Lee, Yunki
;
Park, Jonghoon
... - p. 353-354 , 2022
Link:
https://doi.org/10.1109/VLSITechnologyandCir46769.2022..
RT T1 <cTitle>2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>Advanced novel optical stack technologies for high SNR in CMOS Image Sensor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9830428&Exemplar=1&LAN=DE A1 Park, Hye Yeon A1 Lee, Yunki A1 Park, Jonghoon A1 Song, Hyunseok A1 Lee, Taesung A1 Gweon, Hyung Keun A1 Jung, Yunji A1 Bae, Jeongmin A1 Kim, Boseong A1 Han, Junwon A1 Kim, Seungwon A1 Yoon, Cheolsang A1 Kim, Jeongki A1 Lee, Changkeun A1 Yoo, Sehoon A1 Kim, EuiYeol A1 Baek, Hyunmin A1 Park, Howoo A1 Kim, Bumsuk A1 Ahn, JungChak A1 Yim, JoonSeo YR 2022 SN 2158-9682 K1 Optical filters K1 Optical losses K1 Sensitivity K1 Image resolution K1 CMOS image sensors K1 Very large scale integration K1 Optical imaging SP 353 OP 354 LK http://dx.doi.org/https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830428 DO https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830428 SF ELIB - SuUB Bremen
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