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1 Ergebnisse
1
A 12nm 121-TOPS/W 41.6-TOPS/mm2 All Digital Full Precision ..:
, In:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Lee, Chia-Fu
;
Lu, Cheng-Han
;
Lee, Cheng-En
... - p. 24-25 , 2022
Link:
https://doi.org/10.1109/VLSITechnologyandCir46769.2022..
RT T1 <cTitle>2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>A 12nm 121-TOPS/W 41.6-TOPS/mm2 All Digital Full Precision SRAM-based Compute-in-Memory with Configurable Bit-width For AI Edge Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9830438&Exemplar=1&LAN=DE A1 Lee, Chia-Fu A1 Lu, Cheng-Han A1 Lee, Cheng-En A1 Mori, Haruki A1 Fujiwara, Hidehiro A1 Shih, Yi-Chun A1 Chou, Tan-Li A1 Chih, Yu-Der A1 Chang, Tsung-Yung Jonathan YR 2022 SN 2158-9682 K1 Power measurement K1 Power demand K1 Scalability K1 Neural networks K1 Very large scale integration K1 Delays K1 Topology SP 24 OP 25 LK http://dx.doi.org/https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830438 DO https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830438 SF ELIB - SuUB Bremen
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