I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A 12-bit 8GS/s RF Sampling DAC with Code-Dependent Nonlinea..:
, In:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Koo, Byeongwoo
;
Do, Sunghan
;
Nam, Sangpil
... - p. 86-87 , 2022
Link:
https://doi.org/10.1109/VLSITechnologyandCir46769.2022..
RT T1 <cTitle>2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>A 12-bit 8GS/s RF Sampling DAC with Code-Dependent Nonlinearity Compensation and Intersegmental Current-Mismatch Calibration in 5nm FinFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9830442&Exemplar=1&LAN=DE A1 Koo, Byeongwoo A1 Do, Sunghan A1 Nam, Sangpil A1 Shin, Heewook A1 Lee, Sungno A1 Oh, Eunhye A1 Hong, Jaemin A1 Lee, Jungho A1 Cho, Youngjae A1 Choi, Michael A1 Shin, Jongshin YR 2022 SN 2158-9682 K1 Radio frequency K1 Microprocessors K1 Linearity K1 Computer architecture K1 Switches K1 Very large scale integration K1 FinFETs K1 DAC K1 RF sampling K1 nonlinearity compensation K1 current cell calibration K1 and serializer SP 86 OP 87 LK http://dx.doi.org/https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830442 DO https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830442 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
