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1 Ergebnisse
1
First Demonstration of 1-bit Erase in Vertical NAND Flash M..:
, In:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
,
Yoo, Ho-Nam
;
Back, Jong-Won
;
Kim, Nam-Hun
... - p. 304-305 , 2022
Link:
https://doi.org/10.1109/VLSITechnologyandCir46769.2022..
RT T1 <cTitle>2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</cTitle>: T1 <Title>First Demonstration of 1-bit Erase in Vertical NAND Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9830445&Exemplar=1&LAN=DE A1 Yoo, Ho-Nam A1 Back, Jong-Won A1 Kim, Nam-Hun A1 Kwon, Dongseok A1 Park, Byung-Gook A1 Lee, Jong-Ho YR 2022 SN 2158-9682 K1 Fluctuations K1 Switches K1 Very large scale integration K1 Control systems K1 Flash memories K1 Voltage control K1 Artificial intelligence K1 VNAND K1 1-bit erase K1 GIDL K1 IBL (or Vth) dispersion SP 304 OP 305 LK http://dx.doi.org/https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830445 DO https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830445 SF ELIB - SuUB Bremen
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