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Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Alam, Md Nur K. ; Higashi, Yusuke ; Truijen, B.... - p. 340-342 , 2022
Link: https://doi.org/10.1109/VLSITechnologyandCir46769.2022..