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1 Ergebnisse
1
Comparing Convolutional Neural Networks and Deep Metric Lea..:
, In:
2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)
,
Contreras, Kenji
;
Henry, Anel
;
Caceres-Hernandez, Danilo
. - p. 1141-1146 , 2022
Link:
https://doi.org/10.1109/ISIE51582.2022.9831572
RT T1 <cTitle>2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)</cTitle>: T1 <Title>Comparing Convolutional Neural Networks and Deep Metric Learning Methods for Classification of Export Watermelon (Citrullus lanatus) Varieties</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9831572&Exemplar=1&LAN=DE A1 Contreras, Kenji A1 Henry, Anel A1 Caceres-Hernandez, Danilo A1 Sanchez-Galan, Javier E. YR 2022 SN 2163-5145 K1 Measurement K1 Learning systems K1 Transfer learning K1 Neural networks K1 Image retrieval K1 Generative adversarial networks K1 Convolutional neural networks K1 Watermelon K1 Convolutional Neural Networks K1 Transfer Learning K1 Deep Metric Learning K1 PCA K1 Triple Loss Function SP 1141 OP 1146 LK http://dx.doi.org/https://doi.org/10.1109/ISIE51582.2022.9831572 DO https://doi.org/10.1109/ISIE51582.2022.9831572 SF ELIB - SuUB Bremen
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