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1 Ergebnisse
1
Image Quality Assessment by Integration of Low-level & High..:
, In:
2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)
,
Chaudhary, Jatin
;
Pant, Dibakar Raj
;
Pokharel, Suresh
... - p. 135-141 , 2022
Link:
https://doi.org/10.1109/ISIE51582.2022.9831651
RT T1 <cTitle>2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)</cTitle>: T1 <Title>Image Quality Assessment by Integration of Low-level & High-Level Features: Threshold Similarity Index</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9831651&Exemplar=1&LAN=DE A1 Chaudhary, Jatin A1 Pant, Dibakar Raj A1 Pokharel, Suresh A1 Skon, Jukka-Pekka A1 Heikkonen, Jukka A1 Kanth, Rajeev YR 2022 SN 2163-5145 K1 Image quality K1 Training K1 Industrial electronics K1 Deep learning K1 Image processing K1 Image edge detection K1 Generative adversarial networks K1 Threshold Similarity Index K1 Feature Similarity Index K1 Structural Similarity Index K1 Image Quality Assessment SP 135 OP 141 LK http://dx.doi.org/https://doi.org/10.1109/ISIE51582.2022.9831651 DO https://doi.org/10.1109/ISIE51582.2022.9831651 SF ELIB - SuUB Bremen
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