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1 Ergebnisse
1
A fault diagnosis method in industrial processes with integ..:
, In:
2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)
,
Deng, Zhenyu
;
Han, Te
;
Liu, Ruonan
. - p. 1170-1173 , 2022
Link:
https://doi.org/10.1109/ISIE51582.2022.9831753
RT T1 <cTitle>2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)</cTitle>: T1 <Title>A fault diagnosis method in industrial processes with integrated feature space and optimized random forest</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9831753&Exemplar=1&LAN=DE A1 Deng, Zhenyu A1 Han, Te A1 Liu, Ruonan A1 Zhi, Fengyao YR 2022 SN 2163-5145 K1 Fault diagnosis K1 Industrial electronics K1 Dimensionality reduction K1 Fault detection K1 Benchmark testing K1 Feature extraction K1 Stability analysis K1 fault diagnosis K1 integrated feature space K1 industrial process K1 machine learning SP 1170 OP 1173 LK http://dx.doi.org/https://doi.org/10.1109/ISIE51582.2022.9831753 DO https://doi.org/10.1109/ISIE51582.2022.9831753 SF ELIB - SuUB Bremen
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