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Effectiveness on C Flaws Checking and Removal:

, In: 2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S),
Inacio, Joao ; Medeiros, Iberia - p. 33-34 , 2022
Link: https://doi.org/10.1109/DSN-S54099.2022.00021