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1 Ergebnisse
1
QuFI: a Quantum Fault Injector to Measure the Reliability o..:
, In:
2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
,
Oliveira, Daniel
;
Giusto, Edoardo
;
Dri, Emanuele
... - p. 137-149 , 2022
Link:
https://doi.org/10.1109/DSN53405.2022.00025
RT T1 <cTitle>2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)</cTitle>: T1 <Title>QuFI: a Quantum Fault Injector to Measure the Reliability of Qubits and Quantum Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9833778&Exemplar=1&LAN=DE A1 Oliveira, Daniel A1 Giusto, Edoardo A1 Dri, Emanuele A1 Casciola, Nadir A1 Baheri, Betis A1 Guan, Qiang A1 Montrucchio, Bartolomeo A1 Rech, Paolo YR 2022 SN 2158-3927 K1 Fault diagnosis K1 Sensitivity K1 Quantum algorithm K1 Computational modeling K1 Qubit K1 Circuit faults K1 Quantum circuit K1 Quantum Computing K1 Fault Tolerance K1 Fault Injection K1 Reliability Evaluation SP 137 OP 149 LK http://dx.doi.org/https://doi.org/10.1109/DSN53405.2022.00025 DO https://doi.org/10.1109/DSN53405.2022.00025 SF ELIB - SuUB Bremen
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