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Empirical Modelling of ReRAM Measured Characteristics Using..:

, In: 2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST),
Al Chawa, M. M. ; de Benito, C. ; Castan, H.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/MOCAST54814.2022.9837658