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1 Ergebnisse
1
Empirical Modelling of ReRAM Measured Characteristics Using..:
, In:
2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)
,
Al Chawa, M. M.
;
de Benito, C.
;
Castan, H.
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/MOCAST54814.2022.9837658
RT T1
2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)
: T1
Empirical Modelling of ReRAM Measured Characteristics Using Charge and Flux
UL https://suche.suub.uni-bremen.de/peid=ieee-9837658&Exemplar=1&LAN=DE A1 Al Chawa, M. M. A1 de Benito, C. A1 Castan, H. A1 Duenas, S. A1 Stavrinides, S. G. A1 Tetzlaff, R. A1 Picos, R. YR 2022 K1 Performance evaluation K1 Circuits and systems K1 Fitting K1 Memristors K1 Data models K1 Behavioral sciences K1 Integrated circuit modeling K1 ReRAM K1 memristor K1 modeling K1 flux K1 charge SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/MOCAST54814.2022.9837658 DO https://doi.org/10.1109/MOCAST54814.2022.9837658 SF ELIB - SuUB Bremen
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