I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Layout-level Vulnerability Ranking from Electromagnetic Fau..:
, In:
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
,
Lin, Lang
;
Wen, Jimin
;
Shrivastav, Harsh
... - p. 17-20 , 2022
Link:
https://doi.org/10.1109/HOST54066.2022.9840146
RT T1
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
: T1
Layout-level Vulnerability Ranking from Electromagnetic Fault Injection
UL https://suche.suub.uni-bremen.de/peid=ieee-9840146&Exemplar=1&LAN=DE A1 Lin, Lang A1 Wen, Jimin A1 Shrivastav, Harsh A1 Li, Weike A1 Chen, Hua A1 Ni, Gang A1 Chowdhury, Sreeja A1 Chow, Calvin A1 Chang, Norman YR 2022 K1 Solid modeling K1 Three-dimensional displays K1 Computational modeling K1 Wires K1 Parallel processing K1 Silicon K1 Numerical models K1 Electromagnetic fault injection K1 Pre-silicon simulation K1 Inductance extraction SP 17 OP 20 LK http://dx.doi.org/https://doi.org/10.1109/HOST54066.2022.9840146 DO https://doi.org/10.1109/HOST54066.2022.9840146 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)