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The approach to the concept of measurement error in the tex..:

, In: 2022 Congreso de Tecnología, Aprendizaje y Enseñanza de la Electrónica (XV Technologies Applied to Electronics Teaching Conference),
Medrano-Sanchez, Carlos ; Martinez-Cesteros, Javier ; Arcega-Solsona, Francisco. - p. 1-7 , 2022
Link: https://doi.org/10.1109/TAEE54169.2022.9840680