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1 Ergebnisse
1
Automatic lab system for optical, electrical, and thermal i..:
, In:
2022 Congreso de Tecnología, Aprendizaje y Enseñanza de la Electrónica (XV Technologies Applied to Electronics Teaching Conference)
,
Vega, Carlos
;
Vega, Aurelio
;
Merino, Irene
. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/TAEE54169.2022.9840735
RT T1
2022 Congreso de Tecnología, Aprendizaje y Enseñanza de la Electrónica (XV Technologies Applied to Electronics Teaching Conference)
: T1
Automatic lab system for optical, electrical, and thermal inspection of PCBs
UL https://suche.suub.uni-bremen.de/peid=ieee-9840735&Exemplar=1&LAN=DE A1 Vega, Carlos A1 Vega, Aurelio A1 Merino, Irene A1 Perez, Oscar YR 2022 SN 2766-2616 K1 Temperature measurement K1 Voltage measurement K1 Education K1 Maintenance engineering K1 Optical imaging K1 Wind turbines K1 Telecommunications K1 optical inspection K1 electrical test K1 thermal analysis SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/TAEE54169.2022.9840735 DO https://doi.org/10.1109/TAEE54169.2022.9840735 SF ELIB - SuUB Bremen
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