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A Deep Learning-Based Model for Automated Quality Control i..:

, In: 2022 IEEE 46th Annual Computers, Software, and Applications Conference (COMPSAC),
Raab, Dominik ; Fezer, Eric ; Breitenbach, Johannes... - p. 266-271 , 2022
Link: https://doi.org/10.1109/COMPSAC54236.2022.00045