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1 Ergebnisse
1
SemiCon: A Semi-supervised Learning for Industrial Image In..:
, In:
2022 IEEE 9th International Conference on Cyber Security and Cloud Computing (CSCloud)/2022 IEEE 8th International Conference on Edge Computing and Scalable Cloud (EdgeCom)
,
Tang, Weitao
;
Zhang, Tonglin
;
Yang, Baijian
- p. 12-17 , 2022
Link:
https://doi.org/10.1109/CSCloud-EdgeCom54986.2022.0001
RT T1 <cTitle>2022 IEEE 9th International Conference on Cyber Security and Cloud Computing (CSCloud)/2022 IEEE 8th International Conference on Edge Computing and Scalable Cloud (EdgeCom)</cTitle>: T1 <Title>SemiCon: A Semi-supervised Learning for Industrial Image Inspection</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9843115&Exemplar=1&LAN=DE A1 Tang, Weitao A1 Zhang, Tonglin A1 Yang, Baijian YR 2022 SN 2693-8928 K1 Deep learning K1 Training K1 Computer vision K1 Cloud computing K1 Visualization K1 Annotations K1 Conferences K1 semi-supervised learning K1 contrastive learning K1 defect inspection K1 cross entropy K1 vector based inference SP 12 OP 17 LK http://dx.doi.org/https://doi.org/10.1109/CSCloud-EdgeCom54986.2022.00012 DO https://doi.org/10.1109/CSCloud-EdgeCom54986.2022.00012 SF ELIB - SuUB Bremen
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