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1 Ergebnisse
1
Electrical metrology based on quantum technology: a review ..:
, In:
2022 IEEE 5th International Electrical and Energy Conference (CIEEC)
,
Wang, Siyun
;
Duan, Meimei
;
Xu, Qing
... - p. 3062-3067 , 2022
Link:
https://doi.org/10.1109/CIEEC54735.2022.9845825
RT T1 <cTitle>2022 IEEE 5th International Electrical and Energy Conference (CIEEC)</cTitle>: T1 <Title>Electrical metrology based on quantum technology: a review of current progress</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9845825&Exemplar=1&LAN=DE A1 Wang, Siyun A1 Duan, Meimei A1 Xu, Qing A1 Lu, Zigang A1 Xia, Guofang A1 Gong, Dan A1 Yi, Yongxian A1 Bao, Jin YR 2022 K1 Temperature measurement K1 Voltage measurement K1 Uncertainty K1 Current measurement K1 Conferences K1 Measurement uncertainty K1 Humidity K1 quantum voltage K1 Josephson effect K1 application SP 3062 OP 3067 LK http://dx.doi.org/https://doi.org/10.1109/CIEEC54735.2022.9845825 DO https://doi.org/10.1109/CIEEC54735.2022.9845825 SF ELIB - SuUB Bremen
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