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1 Ergebnisse
1
Influence of Gate Resistance on Crosstalk of SiC MOSFETs:
, In:
2022 IEEE 5th International Electrical and Energy Conference (CIEEC)
,
Xu, Hao
;
Cai, Yumeng
;
Sun, Peng
. - p. 4287-4292 , 2022
Link:
https://doi.org/10.1109/CIEEC54735.2022.9846812
RT T1
2022 IEEE 5th International Electrical and Energy Conference (CIEEC)
: T1
Influence of Gate Resistance on Crosstalk of SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9846812&Exemplar=1&LAN=DE A1 Xu, Hao A1 Cai, Yumeng A1 Sun, Peng A1 Zhao, Zhibin YR 2022 K1 Resistance K1 MOSFET K1 Inductance K1 Silicon carbide K1 Crosstalk K1 Bridge circuits K1 Logic gates K1 crosstalk K1 gate resistance K1 SiC MOSFETs K1 half-bridge SP 4287 OP 4292 LK http://dx.doi.org/https://doi.org/10.1109/CIEEC54735.2022.9846812 DO https://doi.org/10.1109/CIEEC54735.2022.9846812 SF ELIB - SuUB Bremen
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