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Automatic Cephalometric Analysis using Machine Learning:

, In: 2022 2nd International Conference on Intelligent Technologies (CONIT),
Sobhana, M. ; Vemulapalli, Krishna Rohith ; Appala, Lahari. - p. 1-5 , 2022
Link: https://doi.org/10.1109/CONIT55038.2022.9848060