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1 Ergebnisse
1
DC-Microgrid Fault Detection & Classification Using ANN Ena..:
, In:
2022 Trends in Electrical, Electronics, Computer Engineering Conference (TEECCON)
,
Pati, Sudhansu Bhusan
;
Barik, Subrat Kumar
;
Kundu, Subhasri
.. - p. 67-71 , 2022
Link:
https://doi.org/10.1109/TEECCON54414.2022.9854825
RT T1 <cTitle>2022 Trends in Electrical, Electronics, Computer Engineering Conference (TEECCON)</cTitle>: T1 <Title>DC-Microgrid Fault Detection & Classification Using ANN Enabled BAT Algorithm</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9854825&Exemplar=1&LAN=DE A1 Pati, Sudhansu Bhusan A1 Barik, Subrat Kumar A1 Kundu, Subhasri A1 Dash, Ritesh A1 Ballaji, Adithya YR 2022 K1 Fault detection K1 Prototypes K1 Microgrids K1 Voltage K1 Market research K1 Power electronics K1 Mathematical models K1 DC Microgrid K1 ANN K1 BAT Algorithm SP 67 OP 71 LK http://dx.doi.org/https://doi.org/10.1109/TEECCON54414.2022.9854825 DO https://doi.org/10.1109/TEECCON54414.2022.9854825 SF ELIB - SuUB Bremen
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