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1 Ergebnisse
1
Application of Genetic Algorithm for Calibration of an X-ba..:
, In:
2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials (EDM)
,
Fedorov, Evgeniy A.
;
Sheyerman, Feodor I.
;
Pomazanov, Alexey V.
... - p. 101-104 , 2022
Link:
https://doi.org/10.1109/EDM55285.2022.9855052
RT T1 <cTitle>2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials (EDM)</cTitle>: T1 <Title>Application of Genetic Algorithm for Calibration of an X-band Vector-sum Phase Shifter with Integrated Auxiliary DAC</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9855052&Exemplar=1&LAN=DE A1 Fedorov, Evgeniy A. A1 Sheyerman, Feodor I. A1 Pomazanov, Alexey V. A1 Kokolov, Andrey A. A1 Minenko, Dmitriy E. A1 Babak, Leonid I. YR 2022 SN 2325-419X K1 Heuristic algorithms K1 Phase shifters K1 Optimization methods K1 BiCMOS integrated circuits K1 Calibration K1 Electron devices K1 Genetic algorithms K1 Vector-sum phase shifter K1 genetic algorithm K1 DAC K1 optimization K1 X-band SP 101 OP 104 LK http://dx.doi.org/https://doi.org/10.1109/EDM55285.2022.9855052 DO https://doi.org/10.1109/EDM55285.2022.9855052 SF ELIB - SuUB Bremen
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