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Self-awareness approach for complete coverage metrology usi..:

, In: 2022 IEEE 9th International Workshop on Metrology for AeroSpace (MetroAeroSpace),
Minano, Miguel Espinosa ; Pena, Pablo Flores ; He, Zhuoyao. - p. 13-17 , 2022
Link: https://doi.org/10.1109/MetroAeroSpace54187.2022.98562..