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Flicker Noise Characterization of LDMOS In Finfet Technolog:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
Guo, Junwei ; Guo, Yuning ; Liu, Yali. - p. 1-3 , 2022
Link: https://doi.org/10.1109/CSTIC55103.2022.9856730