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1 Ergebnisse
1
Influence of Parasitic Capacitance and Resistance on Perfor..:
, In:
2022 China Semiconductor Technology International Conference (CSTIC)
,
Luo, Yanna
;
Yan, Gangping
;
Cao, Lei
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/CSTIC55103.2022.9856731
RT T1
2022 China Semiconductor Technology International Conference (CSTIC)
: T1
Influence of Parasitic Capacitance and Resistance on Performance of 6T-SRAM for Advanced CMOS Circuits Design
UL https://suche.suub.uni-bremen.de/peid=ieee-9856731&Exemplar=1&LAN=DE A1 Luo, Yanna A1 Yan, Gangping A1 Cao, Lei A1 Huo, Jiali A1 Zhang, Xuexiang A1 Wei, Yanzhao A1 Tian, Guoliang A1 Zhang, Qingzhu A1 Wu, Zhenhua A1 Yin, Huaxiang YR 2022 K1 Resistance K1 Layout K1 Random access memory K1 Routing K1 CMOS technology K1 Stability analysis K1 Circuit stability K1 CMOS K1 6T-SRAM K1 parasitic resistance K1 parasitic capacitance K1 layout SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC55103.2022.9856731 DO https://doi.org/10.1109/CSTIC55103.2022.9856731 SF ELIB - SuUB Bremen
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