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1 Ergebnisse
1
Conditionally Executed Tests, Branching and Algorithmic Bin..:
, In:
2022 China Semiconductor Technology International Conference (CSTIC)
,
Chan, Lai-Choon
- p. 1-3 , 2022
Link:
https://doi.org/10.1109/CSTIC55103.2022.9856766
RT T1 <cTitle>2022 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>Conditionally Executed Tests, Branching and Algorithmic Binning - Getting IT Right</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9856766&Exemplar=1&LAN=DE A1 Chan, Lai-Choon YR 2022 K1 Performance evaluation K1 Computer bugs K1 Maintenance engineering K1 Encoding K1 Complexity theory K1 Task analysis K1 Testing SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC55103.2022.9856766 DO https://doi.org/10.1109/CSTIC55103.2022.9856766 SF ELIB - SuUB Bremen
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