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Few-Shot Image Classification Benchmarks are Too Far From R..:

, In: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Bennequin, Etienne ; Tami, Myriam ; Toubhans, Antoine. - p. 4766-4775 , 2022
Link: https://doi.org/10.1109/CVPRW56347.2022.00523