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NTIRE 2022 Challenge on High Dynamic Range Imaging: Methods..:

, In: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),

Perez-Pellitero, Eduardo ; Catley-Chandar, Sibi ; Shaw, Richard... - p. 1008-1022 , 2022

Link: https://doi.org/10.1109/CVPRW56347.2022.00114

RT 
T1 <cTitle>2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</cTitle>: T1 <Title>NTIRE 2022 Challenge on High Dynamic Range Imaging: Methods and Results</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9856998&Exemplar=1&LAN=DE
				
A1 Perez-Pellitero, Eduardo
A1 Catley-Chandar, Sibi
A1 Shaw, Richard
A1 Leonardis, Ales
A1 Timofte, Radu
A1 Zhang, Zexin
A1 Liu, Cen
A1 Peng, Yunbo
A1 Lin, Yue
A1 Yu, Gaocheng
A1 Zhang, Jin
A1 Ma, Zhe
A1 Wang, Hongbin
A1 Chen, Xiangyu
A1 Wang, Xintao
A1 Wu, Haiwei
A1 Liu, Lin
A1 Dong, Chao
A1 Zhou, Jiantao
A1 Yan, Qingsen
A1 Zhang, Song
A1 Chen, Weiye
A1 Liu, Yuhang
A1 Zhang, Zhen
A1 Zhang, Yanning
A1 Shi, Javen Qinfeng
A1 Gong, Dong
A1 Zhu, Dan
A1 Sun, Mengdi
A1 Chen, Guannan
A1 Hu, Yang
A1 Li, Haowei
A1 Zou, Baozhu
A1 Liu, Zhen
A1 Lin, Wenjie
A1 Jiang, Ting
A1 Jiang, Chengzhi
A1 Li, Xinpeng
A1 Han, Mingyan
A1 Fan, Haoqiang
A1 Sun, Jian
A1 Liu, Shuaicheng
A1 Marin-Vega, Juan
A1 Sloth, Michael
A1 Schneider-Kamp, Peter
A1 Rottger, Richard
A1 Li, Chunyang
A1 Bao, Long
A1 He, Gang
A1 Xu, Ziyao
A1 Xu, Li
A1 Zhan, Gen
A1 Sun, Ming
A1 Wen, Xing
A1 Li, Junlin
A1 Li, Jinjing
A1 Li, Chenghua
A1 Gang, Ruipeng
A1 Li, Fangya
A1 Liu, Chenming
A1 Feng, Shuang
A1 Lei, Fei
A1 Liu, Rui
A1 Ruan, Junxiang
A1 Dai, Tianhong
A1 Li, Wei
A1 Lu, Zhan
A1 Liu, Hengyan
A1 Huang, Peian
A1 Ren, Guangyu
A1 Luo, Yonglin
A1 Liu, Chang
A1 Tu, Qiang
A1 Li, Fangya
A1 Gang, Ruipeng
A1 Li, Chenghua
A1 Li, Jinjing
A1 Ma, Sai
A1 Liu, Chenming
A1 Cao, Yizhen
A1 Tel, Steven
A1 Heyrman, Barthelemy
A1 Ginhac, Dominique
A1 Lee, Chul
A1 Kim, Gahyeon
A1 Park, Seonghyun
A1 Vien, An Gia
A1 Thanh Nhat Mai, Truong
A1 Yoon, Howoon
A1 Vo, Tu
A1 Holston, Alexander
A1 Zaheer, Sheir
A1 Park, Chan Y.
YR 2022
SN 2160-7516
K1 Computer vision
K1 Runtime
K1 Conferences
K1 Imaging
K1 Dynamic range
K1 Particle measurements
K1 Market research
SP 1008
OP 1022
LK http://dx.doi.org/https://doi.org/10.1109/CVPRW56347.2022.00114
DO https://doi.org/10.1109/CVPRW56347.2022.00114
SF ELIB - SuUB Bremen

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