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Area Under the ROC Curve Maximization for Metric Learning:

, In: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Gajic, Bojana ; Amato, Ariel ; Baldrich, Ramon.. - p. 2806-2815 , 2022
Link: https://doi.org/10.1109/CVPRW56347.2022.00318