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1 Ergebnisse
1
Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CM..:
, In:
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Jain, A.
;
Veggetti, A.
;
Crippa, D.
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/RADECS50773.2020.9857678
RT T1
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology
UL https://suche.suub.uni-bremen.de/peid=ieee-9857678&Exemplar=1&LAN=DE A1 Jain, A. A1 Veggetti, A. A1 Crippa, D. A1 Benfante, A. A1 Gerardin, S. A1 Bagatin, M. A1 Cazzaniga, C. YR 2020 SN 1609-0438 K1 Radiation hardening (electronics) K1 Error analysis K1 Logic circuits K1 Design methodology K1 Europe K1 Neutrons K1 Ions K1 Soft error K1 single-event upset K1 single-event K1 Flip-flop K1 sequential logic circuits SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/RADECS50773.2020.9857678 DO https://doi.org/10.1109/RADECS50773.2020.9857678 SF ELIB - SuUB Bremen
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