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Total Ionizing Dose Hardness Enhancement at Room Temperatur..:
, In:
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Cussac, G.
;
Artola, L.
;
Nuns, T.
. - p. 1-8 , 2020
Link:
https://doi.org/10.1109/RADECS50773.2020.9857680
RT T1
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Total Ionizing Dose Hardness Enhancement at Room Temperature in CMOS 0.25µm Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-9857680&Exemplar=1&LAN=DE A1 Cussac, G. A1 Artola, L. A1 Nuns, T. A1 Ducret, S. YR 2020 SN 1609-0438 K1 Semiconductor device modeling K1 Resistance K1 Degradation K1 MOSFET K1 Annealing K1 Europe K1 Simulated annealing K1 Annealing effects K1 cryogenic effects K1 hardening K1 TCAD simulation K1 total ionizing dose effects SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/RADECS50773.2020.9857680 DO https://doi.org/10.1109/RADECS50773.2020.9857680 SF ELIB - SuUB Bremen
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